Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) Principle, Working, Types, Advantages and Applications 👉What is Atomic Force Microscopy (AFM)? •Atomic Force Microscopy (AFM) is a high-resolution type of scanning probe microscopy technique that allows imaging , measuring and manipulating matter at nanoscale . •AFM can analyze both conducting and non-conducting samples , which makes it highly useful in chemistry, material science, and nanotechnology . 👉Principle of Atomic Force Microscopy:- •AFM works on the principle of measuring the interatomic forces between a sharp probe tip and the sample surface. •A sharp tip (made of Si or Silicon nitride ); attached to a cantilever , scans the sample surface. •When the tip approaches the surface: Forces like Vander wall , electrostatic ,attractive or repulsive forces act between the tip and sample. •These forces cause deflection of the cantilever. •The deflection is detected using a laser–photodiode system . •The detected signal is processed to ge...